Best Paper Award for Marco Pocaterra and Dr. Mauro Ciappa
Marco Pocaterra and Dr. Mauro Ciappa from the Integrated Systems Laboratory (IIS) received the Best Paper Award at the 33rd European Symposium on Reliability of Electron Devices and Physics (ESREF 2022) organized by the Fraunhofer Gesellschaft in Berlin from September 26 to 29, 2022.
The authors of the paper titled
external pageCharacterization of the carriers' multiplication in Si and SiC power devices by soft-gamma irradiation under cryostatic conditions
have been awarded for developing a novel and unconventional approach to characterize the susceptibility of power semiconductors to destructive events produced by terrestrial cosmic rays.
This study will be presented as an invited contribution to the 60th IEEE International Reliability Physics Symposium (IRPS 2023), taking place at Monterey (USA) from March 26 to 30, 2023.