Marco Pocaterra receives Best Paper Award
Marco Pocaterra and Dr. Mauro Ciappa from the Integrated Systems Laboratory received the Best Paper Award at the 30th European Symposium on Reliability of Electron Devices (ESREF).
The symposium was held in Toulouse (France) from 23-26 September 2019 and they received the prize for their research on "Characterization of the Onset of Carrier Multiplication in Power Deviced by a Collimated Radioactive Alpha Source".
This contribution will be presented as an Invited Paper at the 27th IEEE IPFA Symposium, which will take place on 2-5 July 2020 in Singapore.
The paper is published in the external pageElsevier Microelectronics Reliability journal.
Congratulations!